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VGU RESEARCH REPOSITORY


Please use this identifier to cite or link to this item: https://epub.vgu.edu.vn/handle/dlibvgu/1151
Title: Mission-profile based system-level reliability assessment of low-voltage dc microgrid under dynamic and transient operation cases
Authors: Chu Dinh Khoa 
Bui Manh Gioi 
Keywords: DC microgrid;Reliability evaluation;Failure rate
Issue Date: 2021
Abstract: 
In PV generation systems, DC microgrids play a crucial role, responsible for energy distribution and storing to ensure the system operates regardless of the intermittent nature of PV power output. This project’s main purpose is to evaluate the reliability of a DC microgrid that consists of four main parts: the PV generation system, the battery energy storage system, the boost converter and the bidirectional DC/DC converter. First, an
overview of the DC microgrid and the operation, working principles, and related mathematical equations of each part will be provided. Next, the theories and methods to evaluate reliability are discussed details, including nine failure rate models and two approaches (Markov analysis and Monte Carlo simulation). Subsequently, an off-grid LVDC microgrid model is built and tested in multiple dynamic loading conditions, and transient cases (short-circuit, positive and negative pins are ground-connected for multiple components). The dynamic and transient failure rates are afterwards calculated and then the component-level (capacitor, inductor, diode and semiconductor switch), device-level, and system-level reliabilities are evaluated using Markov model. Finally, a presentation on the influences of changing load values and transient errors. The results from this project can therefore be used for a better understanding of the loading and transient conditions
URI(1): http://epub.vgu.edu.vn/handle/dlibvgu/1151
Rights: Attribution-NonCommercial 4.0 International
Appears in Collections:Electrical Engineering and Information Technology (EEIT)

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