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VGU RESEARCH REPOSITORY


Please use this identifier to cite or link to this item: https://epub.vgu.edu.vn/handle/dlibvgu/1151
DC FieldValueLanguage
dc.contributor.authorChu Dinh Khoaen_US
dc.contributor.authorBui Manh Gioien_US
dc.date.accessioned2021-09-30T02:59:26Z-
dc.date.available2021-09-30T02:59:26Z-
dc.date.issued2021-
dc.identifier.urihttp://epub.vgu.edu.vn/handle/dlibvgu/1151-
dc.description.abstractIn PV generation systems, DC microgrids play a crucial role, responsible for energy distribution and storing to ensure the system operates regardless of the intermittent nature of PV power output. This project’s main purpose is to evaluate the reliability of a DC microgrid that consists of four main parts: the PV generation system, the battery energy storage system, the boost converter and the bidirectional DC/DC converter. First, an overview of the DC microgrid and the operation, working principles, and related mathematical equations of each part will be provided. Next, the theories and methods to evaluate reliability are discussed details, including nine failure rate models and two approaches (Markov analysis and Monte Carlo simulation). Subsequently, an off-grid LVDC microgrid model is built and tested in multiple dynamic loading conditions, and transient cases (short-circuit, positive and negative pins are ground-connected for multiple components). The dynamic and transient failure rates are afterwards calculated and then the component-level (capacitor, inductor, diode and semiconductor switch), device-level, and system-level reliabilities are evaluated using Markov model. Finally, a presentation on the influences of changing load values and transient errors. The results from this project can therefore be used for a better understanding of the loading and transient conditionsen_US
dc.language.isoenen_US
dc.rightsAttribution-NonCommercial 4.0 International*
dc.rights.urihttps://creativecommons.org/licenses/by-nc/4.0/*
dc.subjectDC microgriden_US
dc.subjectReliability evaluationen_US
dc.subjectFailure rateen_US
dc.titleMission-profile based system-level reliability assessment of low-voltage dc microgrid under dynamic and transient operation casesen_US
dc.typeThesisen_US
item.fulltextWith Fulltext-
item.languageiso639-1other-
item.grantfulltextrestricted-
Appears in Collections:Electrical Engineering and Information Technology (EEIT)
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