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Please use this identifier to cite or link to this item: https://epub.vgu.edu.vn/handle/dlibvgu/76
DC FieldValueLanguage
dc.contributor.authorAbhishek Kandwalen_US
dc.contributor.authorZedong Nieen_US
dc.contributor.authorLei Wangen_US
dc.contributor.authorLouis W. Y. Liuen_US
dc.contributor.authorRanjan Dasen_US
dc.date.accessioned2020-03-12T16:54:32Z-
dc.date.available2020-03-12T16:54:32Z-
dc.date.issued2019-
dc.identifier.urihttp://epub.vgu.edu.vn/handle/dlibvgu/76-
dc.description.abstractThis paper proposes an efficient transmission line modulation by using the bending technique to realize low profile leaky wave antennas in the Ku-band for frequency scanning and sensor applications. The paper focuses mainly on the bending effects of the transmission line in terms of the sharpness of edges. The right-hand/left-hand transmission line can be designed in the form of zig-zag pattern with sharp corners and only the right-hand transmission line in the form of sinusoidal patterns with smooth corners. In this presentation, we demonstrate that transmission lines of this kind can be used to realize highly efficient leaky wave antennas with broadband impedance matching and high gain characteristics in the Ku-band. Dispersion analysis and ladder network analysis have been performed for investigating the performance of the proposed designs. The sharpness of the bends periodically distributed along the body of the antenna has been used to our advantage for frequency scanning in the left-hand and right-hand quadrants at different frequencies. The proposed bending technique has been proven to be instrumental in achieving the desired characteristics of low profile leaky wave antennas 2265-2277en_US
dc.language.isoenen_US
dc.publisherMDPIen_US
dc.relation.ispartofseriesSensors;Vol.19 (10)-
dc.subjectTransmission lineen_US
dc.subjectModesen_US
dc.subjectLeaky waveen_US
dc.subjectScanningen_US
dc.subjectDispersionen_US
dc.subjectModulationen_US
dc.titleRealization of low profile leaky wave antennas using the bending technique for frequency scanning and sensor applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.3390/s19102265-
dc.relation.journaltypeSCIE Q2en_US
item.languageiso639-1other-
item.grantfulltextopen-
item.fulltextWith Fulltext-
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